University of Delaware - College of Engineering
ELECTRICAL & COMPUTER ENGINEERING

Research Centers & Facilities

 

Return to Research Overview

 

Nanofabrication Facility

Capabilities & Equipment > Characterization Systems

Agilent 85106D Vector Network Analyzer

Our Agilent 85106D is a full 2-port vector network analyzer based on the popular 8510C series. Coupled with our full complement of mixing heads it has capabilities for testing S-parameters from 45 MHz to 325 GHz with wide dynamic range and repeatability. Coupled with the UD’s other supporting equipment, this tool provides capabilities for testing a wide range of materials, components, and systems.

Agilent 85106D

Agilent 85106D

Millimeter wave mixers for S-parameter measurements up to 325 GHz

Millimeter wave mixers for S-parameter measurements up to 325 GHz

Signatone probe station

Signatone probe station

  • Provides complex 2-port S-parameter measurements over the following frequency ranges:
    • Coaxial-coupled full 2-port measurements from 45 MHz- 50 GHz.
    • Waveguide-coupled full 2-port measurements for V (50-75 GHz) and W (75-110 GHz) bands using Agilent 86104.
    • Waveguide-coupled S11 and S21 measurement for WR-06 (110-170 GHz), WR-05 (140-220 GHz), and WR-03 (220-325 GHz) waveguide bands.
  • Full S-parameter calibration kits for each band of operation.
  • Optional 8530 operating system for use in automated antenna pattern measurements.
  • Time domain capability useful for windowing and defect analysis.

In addition to the VNA’s core functionality, UD’s ECE department has a wide range of supporting equipment including:

  • A 1000 ft3 anechoic chamber with rotation stages for antenna and RCS measurements from 2 GHz to 325 GHz.
  • Specialty probe stations designed for the characterization of electro-optic devices with precision fiber alignment stages, electrical probes stages and platen, and GSG electrical probes for device level characterization at frequencies up to 110 GHz.
  • A dielectric measurement table and antenna assemblies for focused free space frequency measurements of materials and surfaces over a range of incident angles useful for dielectric material characterization and FSS measurements.
 


Bookmark and Share