Research Centers & Facilities
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Nanofabrication Facility
Capabilities & Equipment
Characterization Systems
- Cascade Microtech Summit 9000 probe station
- A precise instrument for device characterization, providing a of full measurement range of parametric testing.
- Agilent 85106D Vector Network Analyzer
- S-parameter testing from 45 MHz to 325 GHz
- Agilent 8703B Lightwave Component Analyzer
- Lightwave component analyzer for high-speed characterization of lasers and photodetectors
- Agilent Infiniium DC 86100
- 20GHz Sampling Oscilloscope for digital communications signal analysis
- Agilent 86142B
- Optical Spectrum Analyzer for characterization of optical signals from 0.6–1.7 µm
- Thermo Nicolet Nexus 870 FTIR
- The Thermo Nicolet Nexus 870 Fourier Transform Infrared Spectrometer is equipped with three beam splitters, and is capable of doing continuous scan and step scan.
- Philips X’Pert X-ray
- The Philips X’Pert-MRD diffractometer utilizes a Cu X-ray source at up to 1.8kW of power.
- FEI XL-30 Environmental Scanning Electron Microscope (SEM)
- This SEM possesses a 5-axis sample stage and 20nm resolution, and can image non-conducting samples.
- Confocal Raman Microscope System
- The fiber-coupled Confocal Raman Microscope System is used for spectros copy of condensed matter to study vibrational, rotational, and other low-frequency modes.
- Horiba Jobin-Yvon iHR320 Spectrometer
- The Spectrometer System measures the optoelectronic properties of novel materials & devices, especially electro- and photoluminescence.
- Horiba Jobin-Yvon UVISEL Visible-NearIR Spectroscopic Ellipsometer
- The spectroscopic ellipsometer is used for characterization of thin films and multilayer thin-film stacks, measuring properties such as thickness and refractive index.
- Veeco Dimension 3100 Atomic Force Microscope
- Photo- and Electro-luminescence Characterization System
